Voltage x-ray reflectometry: A method to study electric-field-induced changes to interfacial electronic structures
2023
Article
mms
| Author(s): | Ilse, S. E. and Schütz, Gisela and Goering, E. |
| Journal: | Physical Review Letters |
| Volume: | 131 |
| Number (issue): | 3 |
| Pages: | 036201 |
| Year: | 2023 |
| Publisher: | American Physical Society |
| Department(s): | Modern Magnetic Systems |
| Bibtex Type: | Article (article) |
| Address: | Woodbury, N.Y. |
| DOI: | 10.1103/PhysRevLett.131.036201 |
| ISSN: | 0031-9007 |
| Language: | eng |
| State: | Published |
|
BibTex @article{escidoc:3551297,
title = {Voltage x-ray reflectometry: A method to study electric-field-induced changes to interfacial electronic structures},
author = {Ilse, S. E. and Sch{\"u}tz, Gisela and Goering, E.},
journal = {Physical Review Letters},
volume = {131},
number = {3},
pages = {036201},
publisher = {American Physical Society},
address = {Woodbury, N.Y.},
year = {2023},
doi = {10.1103/PhysRevLett.131.036201}
}
|
|
