Advances in EELS spectroscopy by using new detector and new specimen preparation technologies
2003
Article
zwe-csfm
| Author(s): | Scheu, C. and Gao, M. and Van Benthem, K. and Tsukimoto, S. and Schmidt, S. and Sigle, W. and Richter, G. and Thomas, J. |
| Journal: | Journal of Microscopy-Oxford |
| Volume: | 210 |
| Pages: | 16-24 |
| Year: | 2003 |
| Department(s): | CSF Materials |
| Bibtex Type: | Article (article) |
| DOI: | DOI 10.1046/j.1365-2818.2003.01181.x |
|
BibTex @article{escidoc:4123526,
title = {Advances in EELS spectroscopy by using new detector and new specimen preparation technologies},
author = {Scheu, C. and Gao, M. and Van Benthem, K. and Tsukimoto, S. and Schmidt, S. and Sigle, W. and Richter, G. and Thomas, J.},
journal = {Journal of Microscopy-Oxford},
volume = {210},
pages = {16-24},
year = {2003},
doi = {DOI 10.1046/j.1365-2818.2003.01181.x}
}
|
|