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{Ion beam analysis with monolayer depth resolution using the electrostatic spectrometer at the MPI Stuttgart}

2001

Conference Paper

mms


Author(s): Plachke, D. and Blohm, G. and Fischer, T. and Khellaf, A. and Kruse, O. and Stoll, H. and Carstanjen, H. D.
Book Title: Proceedings of the 16th International Conference on Applications of Accelerators in Research and Industry
Volume: 576
Pages: 458--462
Year: 2001
Series: {American Institute of Physics Conference Proceedings}
Publisher: AIP

Department(s): Modern Magnetic Systems
Bibtex Type: Conference Paper (inproceedings)

Address: Denton, Texas
Language: eng

BibTex

@inproceedings{escidoc:0950,
  title = {{Ion beam analysis with monolayer depth resolution using the electrostatic spectrometer at the MPI Stuttgart}},
  author = {Plachke, D. and Blohm, G. and Fischer, T. and Khellaf, A. and Kruse, O. and Stoll, H. and Carstanjen, H. D.},
  booktitle = {{Proceedings of the 16th International Conference on Applications of Accelerators in Research and Industry}},
  volume = {576},
  pages = {458--462},
  series = {{American Institute of Physics Conference Proceedings}},
  publisher = {AIP},
  address = {Denton, Texas},
  year = {2001}
}