Modern Magnetic Systems
Note: This department has relocated.

Materials analysis with monolayer depth resolution using MeV ion beams

2001

Conference Paper

mms


Author(s): Carstanjen, H. D.
Journal: {Journal of Materials Processing Technology}
Volume: 117
Year: 2001

Department(s): Modern Magnetic Systems
Bibtex Type: Conference Paper (inproceedings)

Address: Las Vegas, USA
Language: eng

BibTex

@inproceedings{escidoc:0901,
  title = {{Materials analysis with monolayer depth resolution using MeV ion beams}},
  author = {Carstanjen, H. D.},
  journal = {{Journal of Materials Processing Technology}},
  volume = {117},
  address = {Las Vegas, USA},
  year = {2001},
  doi = {}
}