Note: Umut Sanli has transitioned from the institute (alumni).
Umut T. Sanli is currently a postdoctoral researcher at the Max Planck Institute for Intelligent Systems. He received his B.Sc. from Anadolu University (Eskisehir/Turkey) in 2009 and M.Sc. from Christian Albrechts University (Kiel/Germany) in 2012, both in materials science and engineering. In 2013, he joined the Max Planck Institute for Intelligent Systems. During his Ph.D. studies, he developed several different types of X-ray optics using innovative approaches for advancing X-ray microscopy. Sanli is skilled in various nano-engineering and characterization techniques including atomic layer deposition, focused ion beam lithography, multi-photon lithography, ellipsometry, microscopy and spectroscopy using electrons and X-rays.
06.09.2019 Oral Presentation at the NANOP 2019 Conference (Munich, Germany)
Title: Bottom-up Fabrication of Advanced X-ray Optics
29.04.2019 Invited Lecture at Bogazici University Physics Department (Istanbul, Turkey)
Title: An introduction to X-ray Microscopy
24.04.2019 Invited Plenary Talk at EMK 2019 (Electron Microscopy Conference,Edirne/Turkey) 
Title: Development of Novel X-ray Lenses
22 February 2019 - Fabrication of X-ray Microscopy Lenses Using 3D Printing (Herkese Bilim ve Teknoloji, In Turkish Language)
07 September 2018 - Novel Polymer Lenses for X-ray Microscopes: Highly Efficient and Low Cost
20 July 2018 - 3D Nanofabrication of high-resolution X-ray focusing lenses
