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Artifacts from manganese reduction in rock samples prepared by focused ion beam (FIB) slicing for X-ray microspectroscopy

2019

Article

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Author(s): Macholdt, D. S. and Förster, J.-D. and Müller, M. and Weber, B. and Kappl, M. and Kilcoyne, A. L. D. and Weigand, M. and Leitner, J. and Jochum, K. P. and Pöhlker, C. and Andreae, M. O.
Journal: {Geoscientific instrumentation, methods and data systems}
Volume: 8
Number (issue): 1
Pages: 97--111
Year: 2019
Publisher: Copernicus Publ.

Department(s): Modern Magnetic Systems
Bibtex Type: Article (article)

Address: G\"ottingen
DOI: 10.5194/gi-8-97-2019
Language: eng

BibTex

@article{escidoc:3040494,
  title = {{Artifacts from manganese reduction in rock samples prepared by focused ion beam (FIB) slicing for X-ray microspectroscopy}},
  author = {Macholdt, D. S. and F\"orster, J.-D. and M\"uller, M. and Weber, B. and Kappl, M. and Kilcoyne, A. L. D. and Weigand, M. and Leitner, J. and Jochum, K. P. and P\"ohlker, C. and Andreae, M. O.},
  journal = {{Geoscientific instrumentation, methods and data systems}},
  volume = {8},
  number = {1},
  pages = {97--111},
  publisher = {Copernicus Publ.},
  address = {G\"ottingen},
  year = {2019}
}