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{Element specific monolayer depth profiling}

2014

Article

mms


Author(s): Macke, S. and Radi, A. and Hamann-Borrero, J. E. and Verna, A. and Bluschke, M. and Brück, S. and Goering, E. and Sutarto, R. and He, F. and Cristiani, G. and Wu, M. and Benckiser, E. and Habermeier, H.-U. and Logvenov, G. and Gauquelin, N. and Botton, G. A. and Kajdos, A. P. and Stemmer, S. and Sawatzky, G. A. and Haverkort, M. W. and Keimer, B. and Hinkov, V.
Journal: {Advanced Materials}
Volume: 26
Number (issue): 38
Pages: 6554--6559
Year: 2014
Publisher: Wiley VCH

Department(s): Modern Magnetic Systems
Bibtex Type: Article (article)

Address: Weinheim
DOI: 10.1002/adma.201402028
Language: eng

BibTex

@article{escidoc:0186,
  title = {{Element specific monolayer depth profiling}},
  author = {Macke, S. and Radi, A. and Hamann-Borrero, J. E. and Verna, A. and Bluschke, M. and Br\"uck, S. and Goering, E. and Sutarto, R. and He, F. and Cristiani, G. and Wu, M. and Benckiser, E. and Habermeier, H.-U. and Logvenov, G. and Gauquelin, N. and Botton, G. A. and Kajdos, A. P. and Stemmer, S. and Sawatzky, G. A. and Haverkort, M. W. and Keimer, B. and Hinkov, V.},
  journal = {{Advanced Materials}},
  volume = {26},
  number = {38},
  pages = {6554--6559},
  publisher = {Wiley VCH},
  address = {Weinheim},
  year = {2014}
}